Defect formation in multiwalled carbon nanotubes under low-energy He and Ne ion irradiation

• Santhana Eswara,
• Jean-Nicolas Audinot,
• Brahime El Adib,
• Maël Guennou,
• Tom Wirtz and
• Patrick Philipp

Beilstein J. Nanotechnol. 2018, 9, 1951–1963, doi:10.3762/bjnano.9.186

• structural features observed in these TEM images correlate very well with corresponding Raman spectra (C, F). In the deconvoluted spectra, Lorentz functions in cyan denote the D, G and D’ peaks while the Gaussian contributions from highly disordered areas are coloured in red. Nuclear and electronic energy

• loss as a function of sample thickness for a) He+ and b) Ne+ irradiation of suspended carbon. Sputter yield a) at the top, and b) at the bottom of the sample as a function of fluence for Ne irradiation of carbon samples of different thicknesses of 10–200 nm. Backscatter yield as a function of gold

Synthesis of Pt nanoparticles and their burrowing into Si due to synergistic effects of ion beam energy losses

• Pravin Kumar,
• Udai Bhan Singh,
• Kedar Mal,
• Sunil Ojha,
• Indra Sulania,
• Dinakar Kanjilal,
• Dinesh Singh and
• Vidya Nand Singh

Beilstein J. Nanotechnol. 2014, 5, 1864–1872, doi:10.3762/bjnano.5.197

• electronic energy loss; Rutherford backscattering spectroscopy; scanning electron microscopy; thin films; transmission electron microscopy; Introduction The emergence of nanotechnology has opened up new research channels in almost every field of science [1][2][3][4][5][6][7][8]. The synthesis of nano

• sputtering and local defects are produced by Sn) leading to the synthesis and burrowing of Pt NPs is evidenced. The Pt NP synthesis mechanism and their burrowing into the silicon is discussed in detail. Keywords: atomic force microscopy; burrowing of nanoparticles; medium-energy ion irradiation; nuclear and